Atomic Force Microscopy - Characterizing the Interaction Between Dopamine and the D1-Receptor with BioScope II AFM from Veeco Instruments
In the present study we used a Veeco Bioscope II atomic force microscope (AFM) to investigate the potential application of force measurements in monitoring the response and binding properties of dopamine D1 receptor upon stimulation with dopamine.
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Atomic Force Microscopy - Features of AFM in High-Resolution Medical Nano-Imaging from Veeco Instruments
In this application note, we demonstrate the utility of AFM in delineating the cause of cataracts. High-resolution imaging of native lens membranes and the constitutive protein components was achieved using a customized Veeco atomic force microscope.
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Atomic Force Microscopy in the Detection of Changes in Cell Morphology of Mutant Huntingtin Using BioScope II AFM from Veeco Instruments
The high resolution imaging capability of AFM has recently facilitated the construction of atomic models of supramolecular assemblies from topographical images of photosynthetic proteins and channel proteins.
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Automatic Step Detection - Automatic Step Measurement with Dektak Surface Profilers by Veeco Instruments
Dektak stylus profilers provide accurate step height measurements from several nanometers through hundreds of microns, with repeatability down to 7.5 Angstroms.
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Conductive Atomic Force Microscopy ( AFM ) - Characterizing Conductivity Variations in resistive Sam
Conductive AFM is a powerful current sensing technique for characterizing conductivity variations in resistive samples. It can simultaneously map the topography and current distribution of a sample.
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Imaging DNA-Based Materials Using Atomic Force (AFM) and Scanning Probe (SPM) Microscopy by NT-MDT
With the increasing popularity of DNA- and RNA-based materials, the ability to accurately and repeatably mesure and image these materials is of higher importance. Aspects such as probe radius, substrates and deposition and stability are covered.
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MFP-3D Atomic Force Microscope ( AFM ) from Asylum Research - Suitable for Materials Science, Device
The MFP-3D Stand Alone AFM, is a sensitive and precise AFM with the lowest noise performance. It includes a complete scientific software environment and is ideal for many applications including physics, material science, polymers, chemistry, nanolithography, bioscience, and quantitative nanoscale me
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Nanolithography and Manipulation Combined with Atomic Force Microscopy with The MFP-3D AFM and Micro
Today’s demanding nanolithography and manipulation applications require incredibly precise and flexible instrumentation. The MicroAngelo feature within the MFP-3D System offers the most comprehensive capabilities of any AFM for nanolithography and manipulation applications.
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Nanoscale Thermal Analysis of Polymers Using Atomic Force Microscopy (AFM) by Veeco Instruments
Nanoscale thermal analysis (nTA), a novel technique that allows the determination of the local transition temperature on the surface of a material with nanoscale spatial resolution. NTA can help identify materials and their phase separation and component distribution at the nanoscale.
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NTEGRA Therma – Solutions for Mechanical and Thermal Drift in Scanning and Atomic Force Microscopy b
Analysis of surface and materials using atmoic force microscopy (AFM) and scanning probe microscopy (SPM) can be imited by factors such as mechanical and thermal drift. The NTEGRA Therma from NT-MDT includes design features to overcome these issues.
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