Atomic Layer Deposition Tools from Picosun

Picosun SUNALE P-Series Atomic Layer Deposition (ALD) Reactors

Approved Professional Development Courses from Loughborough University

Zetasizer Nano ZS – Particle Size Analysis, Zeta Potential and Molecular Weight Measurement – Malvern Instruments

Mid-Mountain Materials - A leading manufacturer of industrial textiles

Oxford instruments - materials identification, OES and XRF

Dynamic Ceramic a UK based manufacturer and supplier of Ceramic Components. The UK's leading specialist producer of zirconia, alumina and other advanced ceramics.

Zwick Roell / Your Partner for Materials Testing

A2O3/a-Si

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Characterisation of TiO2 Thin Films and Multilayer Antireflective Coatings - Horiba Jobin Yvon
TiO2 films are extensively studied because of their interesting chemical, electrical and optical properties. In this article, the Spectroscopic Ellipsometry (SE), non-destructive optical technique is demonstrated to be a particularly suitable for thin film characterisation.

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University of Surrey-Short Courses and MSc in Materials science

Particle Size Evaluation and Analysis Instruments - Micromeritics

CILAS state of the art laser particle size analyzers

$X-Ray diffractometers from Shimadzu$

$FIBERStone is a combination of high purity, refractory ceramic and up to 60% by weight of Custom Produced Stainless Steel Fibres$

FIBERStone - high purity, refractory ceramic