Instron has developed a unique solution to simulate drop impact conditions and characterize the performance of materials and microstructures at high strain rates. Designed for R&D or process quality control applications, Instron’s MicroImpact Testing System precisely strikes a specimen at a high rate of speed, while simultaneously measuring force and displacement. It combines a unique instrument design (patent pending) with Instron’s proven Impulse™ technology for acquiring and analyzing impact performance data. Unlike existing test methods that provide only a qualitative assessment, the MicroImpact Testing System precisely measures and calculates impact strength parameters.
With unparalleled ease of use and quality of results, Instron’s MicroImpact Testing System is the next generation tool for measuring and comparing the impact performance properties of microelectronics materials and structures.
Features
- Comprehensive calculation capability with versatile Report Editor Wizard for developing test reports
- Direct integration of deflection measurement data with Impulse test results and analysis
- Accurate energy computation
- Robust and high stiffness design
- Two high-magnifications for precise test setup and failure inspection
- Six digital filter functions with user settable cut-off frequencies and filter order functions
