Introduction
The PILATUS 1M from DECTRIS is a powerful high speed detector for use in small-
angle X-ray scattering (SAXS) applications. It is an ideal choice with very low noise level and very high dynamic ranges for use in a home laboratory or at
synchrotron light sources.
Salient Features
The salient features of PILATUS 1M are:
- Is based on the newly developed CMOS hybrid-pixel technology
- Operates in single-photon-counting mode at room temperature
- Compact size
- High frame rate
- Fully calibrated and ready to use
- Close-circuit water cooling unit for stabilizing temperature
- High dynamic range
- Comprehensive system with a detector, a high-end server, and water cooler. The high-end server helps deal with high data transfer rates and data
acquisition and analysis software package TVX
Technical Specifications
The technical specifications of PILATUS 1M are:
| Number of modules |
2 x 5 = 10 |
| Sensor |
Reverse-biased silicon diode array |
| Sensor thickness |
320 mm |
| Pixel size |
172 x 172 mm2 |
| Format |
981 x 1043 = 1,023,183 pixels |
| Area |
169 x 179 mm2 |
| Intermodule gap |
x: 7 pixels, y: 17 pixels, 8.4% of total area |
| Dynamic range |
20 bits (1:1,048,576) |
| Counting rate per pixel |
> 2 x 106 X-ray/s |
| Energy range |
3 – 30 keV |
| Quantum efficiency (calculated) |
3 keV: 80%
8 keV: 99%
15 keV: 55% |
| Energy resolution |
500 eV |
| Adjustable threshold range |
2 – 20 keV |
| Threshold dispersion |
50 eV |
| Readout time |
3.6 ms |
| Framing rate |
30 Hz |
| Point-spread function |
1 pixel |
| Data formats |
Raw data, TIF, EDF, CBF |
| External trigger/gate |
5V TTL, 3 different modes |
| Software interface |
Through socket connection; clients for EPICS, SPEC and stand-alone operation are available |
| Cooling |
Close-circuit water cooling unit for temperature stabilization |
| Power consumption |
100 W |
| Dimensions (WHD) |
Approx. 300 x 310 x 458 mm |
| Weight |
Approx. 25 kg |
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Applications
The applications of the PILATUS 1M are:
- Small-angle scattering (SAXS)
- Macromolecular crystallography (MX)
- X-ray diffraction (XRD)