The Thermo Scientific NORAN System 7 EDS system features excellent microanalysis capabilities for the modern electron microscopy lab. The system features X-ray detectors with superior sensitivity, digital imaging devices and pulse processors with high-throughput and the most sophisticated software suite available. NORAN System 7 produces precise results and quick answers.
The main features of the NORAN System 7 microanalysis system are:
- Automatic Peak Identification – By using rule-based identification and peak shape de-convolution, elemental peaks are rapidly identified automatically and precisely.
- Confirmation of Elements Present - SpectraCheck both visually and statistically confirms the presence of an element using spectrum simulation and comparison routines to provide both an overlapped spectrum, and a chi-squared value indicating goodness of fit.
- Accurate Peak Intensities - Elemental peak references offer a complete set of spectral peak shapes collected with a typical EDS system. The intensities from these shapes are corrected automatically to match the detector on the microscope, eliminating the need to periodically calibrate the system with standards.
- Precise Matrix Correction – The Phi-Rho-Z model has been proven to have superior performance to all other methods of matrix correction.
The NORAN System 7 redefines X-ray pulse processing. Capable of processing more
than 1,000,000 counts per second, the NORAN System 7 more than doubles previously available count rates. Whether you use Si(Li) or SDD detectors, NORAN System 7 accelerates the path to answers by reducing the amount of time needed to collect data.
- Elemental peaks can be identified quickly and precisely using rule-based identification and peak shape deconvolution
- SpectraCheck both statistically and visually confirms the presence of an element using spectrum simulation and comparison routines, offering both an overlapped spectrum and a chi-squared value indicating goodness of fit
- Elemental peak references offer a complete set of spectral peak shapes collected with a typical EDS system
- The intensities from these shapes are automatically corrected to match the microscope detector, eliminating the need for periodic calibration of the system with standards
- Uses the PROZA Phi-Rho-Z matrix correction algorithm
Point and Shoot Mode
- X-ray analysis and electron imaging are combined
- Single mouse click provides both universal identification and quantitative analysis of the selected areas of interest of the sample
- Areas on the sample are defined using circles, rectangles, points, polygons or with a magic wand tool
- The magic wand tool enables instant, easy, outline of complex areas without having to manually draw a border
- The selection, based on gray levels, is made automatically with just one click
- Selected areas may be studied instantly or multiple areas may be selected for automated analysis
- Processing is performed based on selected settings
- Can provide the required spectral results—from qualitative analysis to quantitative analysis with full standards
- A spectrum is acquired at every point—useful for imaging, X-ray mapping, Linescan and advanced automated analysis
- NORAN System 7 collects data that can be analyzed repeatedly without the need for reacquiring or changing acquisition parameters with a single click
- The collected data can be analyzed at the microscope or take the data offline to a different computer for report preparation
- This feature allows all of the people to perform the same analysis and obtain reliable results
- Powerful multivariate statistical algorithms are used , as created by Paul Kotula et al. and licensed from Sandia National Labs
- Using advanced algorithms, Direct-to-Phase extracts and displays known phases while the data is still being collected
- The EDS system can decide when sufficient statistics have been collected, or visualize the data as it develops
- Data analysis is done along with data collection, the speed of real time phase analysis
- Not only elemental data is presented in maps and spectra, it develops an information-rich picture of the sample composition and it produces complete data ten times faster than current X-ray microanalysis technology