Horiba Scientific has introduced the ULTIMA 2 ICP-OES spectrometer whose innovative design helps boost productivity in laboratories. Such improved productivity is realized through better performance, shorter warm up time, simple techniques and rapid analysis times. It features an introduction area and an exceptional RF generator.
The high-powered performance of the new spectrometer lies in its simplicity. It eliminates movable parts in samples and has lowest detection limits with less reflective surfaces in the optics. The instrument offers high light throughput, excellent spectral resolution and a patented detection system to realize full spectrum acquisition which ranges between 120 and 800 nm.
Key Features:
Product features of the ULTIMA 2 ICP-OES spectrometer are:
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Lowest detection limits through a single view radial
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Excellent spectral resolution of 5 pm at less than 320 nm reduces interferences and offers optional grating to enhance resolution for geological or precious metals
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Continuous wavelength coverage which ranges between 160 and 800 nm as a standard with optional extension to 120 nm for performing far UV analysis of halogen elements enabling the use of alternate wavelengths.
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Precise and rapid analysis with AnalystT software and Rapid Chip electronics.
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HDD detection offers sub-ppb to percent level analysis in a single analysis.
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Win-IMAGE offers a range of about 10 orders of magnitude
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Quick-release torch eliminates alignment and can be demounted completely.
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An exclusive sheath gas feature provides continuous assessment of 30% dissolved solids.
Additionally, line-rich spectra in ICP-AES spectrometer are generally observed. Moreover, it is quite difficult to locate analyte lines that are free from interference from either concomitant element lines or the entire matrix, particularly with matrices like zirconium, tungsten, steel, precious metals and other similar complex matrices.
Typically, known solutions are prepared by analysts, who make profiles for each wavelength at varied concentrations of concomitant elements and analyte, and then opt for a line which does not have any interference but exhibits sufficient sensitivity. This step employed during the development of techniques is difficult and takes plenty of time. Utmost care should be exercised during this step as it can considerably affect the results.
However, this step has been simplified by HORIBA Scientific through Collection of Line Intensity Profiles (CLIP). Analysts can use this option during method development for high resolution sequential ICP-AES, thus eliminating the task of preparing solutions and profiles acquirement. According to the configuration of the instrument like slit combination, diffraction grating, focal length and the order used, the profile of each line can be determined. Also, lines for every element can be selected within a few minutes.
Specifications
The specifications of the ULTIMA 2 ICP-OES spectrometer are provided in the table below:
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Wavelength Range |
160 - 800 nm (optional from 120 nm) |
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Resolution |
5 pm @ <320 nm |
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Detector(s) |
HDD Detection (PMT) |
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Light Source |
Quick-Release Torch |