XGT-5000WR X-Ray Analytical and Imaging Microscope available from HORIBA Scientific has been specifically developed for ELV, WEEE/RoHS, and Chinese RoHS to promote high sensitivity measurement of five elements such as lead, cadmium, chromium, mercury and bromine. X-ray microscope functions are integrated into the system.
The bench top XGT-5000 system features a special X-ray Guide Tube, which enables access to X-ray fluorescence analysis with high spatial resolution, ranging from 1.2 mm to 10 µm. The instrument is equipped with two X-ray guide tubes, which include 1.2 mm and 100 µm tubes as standard and a 10 µm tube as optional. These aspects enable users to easily switch between macro and micro beams, thus accommodating different kinds of experiments. The system does not require vacuum and eliminates sample preparation. Users can simply place the sample into the sample chamber and examine it at standard atmospheric pressure.
In addition, completely integrated software monitors acquisition options, sample movement, composite image generation and data analysis, which comprises quantitative and qualitative analysis. When a sample is placed into the chamber, it takes only seconds until an acquisition is initiated, which is supported by “point and click” selection of the analysis position.
Using automated sample scanning, XRF mapping images can be easily obtained. Additionally, a second detector placed below the sample promotes concurrent acquisition of X-ray transmission images. This technology provides extra structural data which is useful for identifying desired regions or examining the internal structure of a sample. Dewar of liquid nitrogen is equipped within the XGT-5000WR system.
Product features of the XGT-5000WR X-Ray Analytical and Imaging Microscope are:
- Screening analysis of hazardous elements
- Different types of analysis are possible with a single unit
- Simple and precise sample positioning
- Solves analytical problems and complications
- Can be used with various sample size ranging from micro to macro samples
Specifications of the XGT-5000WR X-Ray Analytical and Imaging Microscope are provided in the table below:
||High Purity Si Detector, Transmission X-ray Detector: NaI(Ti) scintillator
||Energy Dispersive X-ray Fluorescence
||Plastic, Metal, Paper, Liquid, Biological Samples
||50 kV/1mA, Rh Target
||Na to U (in sample atmosphere)
||Atmosphere (400x350x40 mm)