HORIBA Scientific has introduced a new, advanced XRF microscope called XGT-7000 X-Ray Analytical Microscope that offers a great combination of elemental analysis and optical observation functions and sets a new benchmark in micro-analysis. The new system also establishes micro-XRF as a standard tool for research and analytical applications.
The system includes unique hardware features that deliver flexibility for all types of measurements. It also features two x-ray guide tubes whose diameters range between 10 µm and 1.2 mm. These guide tubes are controlled through software and enable optimized conditions for various measurements, including macro and micro measurements.
Moreover, with the help of Dual Vacuum Modes, users can easily switch from a high sensitivity full vacuum mode to a localized vacuum mode within seconds. The latter ensures that samples are maintained at atmospheric pressure and simultaneously retains the sensitivity of all elements ranging from sodium to uranium.
In any kind of configuration set up, the seamless combination of optical cameras makes certain that accurate analysis position is located easily and quickly.
Single and Multi-point Analyses:
Through single point and multi-point analyses, high quality spectra can be realized from a single position or from several points across the sample. Element peaks can be located automatically and marked. With the help of fundamental parameters method (FPM), full standard sample calibration and FPM with single standard, users can perform quantitative study down to ppm levels. Thickness can also be determined on multi-layered structures ranging between nm and µm in thickness.
Hyperspectral Mapping Analysis:
A complete EDXRF spectrum at all pixels of the element image is recorded with the SmartMap imaging software and allows spectrum generation from the image’s user-defined regions with corresponding quantitative and qualitative characterization, and also enables post-acquisition element image creation and comparison. Additional insight about a sample’s structure is realized through transmitted X-ray imaging, enabling features to become instantly visible which are otherwise not visible with the naked eye.
Key Features
Product features of the XGT-7000 X-Ray Analytical Microscope are:
- The advanced features of the XGT-7000 micro-XRF system make it suitable for a number of applications, including forensic science, engine wear analysis, electronics, mineralogy, geology, metallurgy, archaeology, museums, pharmaceutics, biology and medicine
- The XGT-7000 covers all aspects, ranging from the inspection of a specific micro area to macro analysis of a wide area, with concurrent XRF and transmission imaging. The various features of the system assure high performance analysis with simple operation
- Highest spatial resolution: HORIBA’s special x-ray guide tube technology delivers superior spatial resolution micro-XRF analysis combined with x-ray beam diameters to 10 µm. The guide tubes provide ultra-narrow, high intensity beams that promote instant and non-destructive analysis of microscopic features
- Transmission X-ray Mapped Imaging: The XGT-7000, combined with XRF imaging, allows users to acquire transmitted X-ray images. The system can be employed to conduct internal structural studies or to locate the desired regions which cannot be seen with the eye. Using a thin perpendicular beam, scanning is done an d this delivers clear images even for round samples like cylindrical parts
- Dual Vacuum Modes: Unique Dual Vacuum Modes in the XGT-7000 system allows the user to easily and quickly switch between the two modes. In Partial Vacuum Mode, the sample can be maintained at atmospheric pressure and simultaneously a vacuum can be drawn around the capillary optics and detector. In Full Vacuum Mode, the whole sample chamber is exposed to vacuum conditions which promote superior sensitivity to light elements The former mode is suitable for assessing water that contains fragile archaeological/museum object and biological tissue
- Complete range of sample sizes: The sample chamber allows analysis of different types of samples, ranging from a mapped analysis of areas measuring 10 x 10 cm to 10 µm spot analysis on a microscopic facet.
Specifications
Specifications of the XGT-7000 X-Ray Analytical Microscope are provided in the table below:
| |
|
| Detector(s) |
High Purity Si Detector, Transmission X-ray Detector: NaI(Ti) scintillator |
| Principle |
Energy Dispersive X-ray Fluorescence |
| Sample Type |
Plastic, Metal, Paper, Liquid, Biological Samples |
| X-Ray Tube |
50 kV/1mA, Rh Target |
| Element Range |
Na to U |
| Sample Chamber |
Vacuum Chamber Model (Max 300x300x80 mm) |