The RAPID II is the most versatile X-ray area detector in the history of materials
analysis. The success of the RAPID II is a testament to the suitability of imaging
plate technology for measuring diffraction patterns and diffuse scattering from a wide range of materials.
The instrument combines an exceptionally large active-area imaging plate that is sensitive to a wide range of radiation sources with the flexibility to
match it with a large variety of X-ray sources and optics. The nature of the imaging plate detector implies that weak measurements can be made easily in the
presence of strong measurements.
The detector combines a well-proven, time-tested design with the lack of a need for calibration and the RAPID II is a detector that can be maintained in the field with a minimum of downtime.
Examples of experiments that can be done on the RAPID II include, phase ID of
powder samples, micro-diffraction mapping down to 10 microns, diffuse scattering, fiber diffraction, small molecule structure analysis, stress and texture
measurements, etc.
Key Features
The product features of the RAPID II are:
- Curved imaging plate provides a large 210° aperture
- Long exposures allowed because of absence of dark current noise
- Large dynamic range achieved with dual photomultiplier design.
- High sensitivity coupled with low readout noise.
- Imaging plate detector sensitive for all potential X-ray targets
- Multiple X-ray source options, from sealed tube to rotating anode generators
- No detector calibration required.
- Low maintenance—all components can be serviced on-site.
- Huge experimental versatility, from powders to single crystals.