The Solver Next is the first to offer a new concept in general purpose SPM. This new design offers "on-board expertise" opening the way for all user levels to acquire quality SPM images in a short amount of time.
The hassle of manual setup has been eliminated. Intuitive automation guides you through the setup, adjustment and samples measurements. The system incorporates smart software, automated head exchange, motorized sample positioning under video monitored control, ergonomic design at a reasonable price - all this makes SPM operation suitable for even a novice. Experienced users will quickly recognize the benefits of the design and be amazed with the Solver Next's simplicity, ease-of-use, high capabilities and quality of images.
The system has closed-loop sensors to compensate for inherent piezoelectric imperfections such as scan nonlinearity, creep and hysteresis. With two built-in automatically interchangeable AFM and STM heads, and two additional removable heads for operating in liquid environments and nanoindentation you now have the freedom to work with a variety of samples, measuring modes and conditions. The Solver Next has an advanced controller with library of scripts and MAC OS compatibility for versatility to meet the many challenges of scientific research.
Key features:
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HeadHiPEX™ (Head High Precision ExChange System) system is intended for measuring heads management. HeadHiPEX™ is completely automated system able to change built-in and external measuring heads keeping head's position under the sample with very high precision
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Automatic multifunctional enclosure IsoShield™ system which is keeping samples in highly homogenous environment like uniform temperature field, constant and controllable humidity, negligible level of parasitic electromagnetic fields and electrostatic free staging. Moreover, this system provides additional safety for users through automatic deployment of laser beam when door is open
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Precision Instrument Navigation System PINpoint™ allows easy-to-use and user friendly navigation on the sample through one-touch tip and objective positioning within optical field of view
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ExpertFBA™ (Expert Fine beam Alignment System) is serving for completely automatic and perfect alignment a cantilever, laser and photodiode
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Electronic adjustment system of scanning field size ScanScaler™ provides easy-to-manage automatic adjustment of scan mode between large (up to 100 um) and small (atomi? scale) samples
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Automated alignment of optical feedback geometry (cantilever-laser-photodiode)
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Motorized focus and zoom of the optical view
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Automated software driven control of measurement modes
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All basic Atomic Force Microscopy techniques - topography, phase imaging, measurement of electric properties, nanolithography and more
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Scanning Tunneling Microscopy
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Wide range of operating conditions for experimentation - in air or liquid
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Low-noise capacitive closed-loop feedback in all three directions (XYZ) provides precision Nanometrology
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Atomic resolution