The Scanning Kelvin Probe (SKP) in a non-contact, non destructive instrument designed to measure the surface work function difference between conducting, coated, or semi-conducting materials and a sample probe. The technique operates using a vibrating capacitance probe, and through a swept backing potential, the work function difference is measured between the scanning probe reference tip and sample surface. The work function can be directly correlated to the surface condition. A unique aspect of the SKP is its ability to make measurements in a humid or gaseous environment.
Application Areas of the scanning kelvin probe include::
- Energy Systems
-
Dipole Layer Formation
-
Display Technologies
-
Fermi-Level Mapping
-
Photo Voltage Spectroscopy
-
Corrosion
-
Coatings
-
Sensors
-
Solar Cells