The DektakXT™ Stylus Profiler from Bruker has an innovative design enabling a repeatability better than 4Å.The key milestone in the performance of the stylus profiler is due to 40 years of Dektak® innovation and industry leadership.
DektakXT offers excellent ease of use, performance and value for better process monitoring from research and development to quality control. The breakthroughs in Dektak allow crucial nanometer-level measurements for the semiconductor, microelectronics, high-brightness LED, solar, medical, and materials science industries.
Key Features
The key features of the DektakXT are:
- Better than 4Å repeatability offering high accuracy
- Single-arch design enables breakthrough scan stability
- Leading-edge “smart electronics” establishes new low noise benchmark
- New hardware configuration offers 40% faster data collection times when compared to previous generations
- 64-bit, parallel processing Vision64 software architecture delivers up to 10 times faster data analyses
- Excellent efficiency and ease of use
- Intuitive Vision64™ user interface workflow simplifies operation
- Self-aligning styli allows effortless tip exchange
- High value from the world leader in stylus profilers
- Bruker delivers premier performance in an affordable package
- Single sensor design offers low force and extended range in a single platform
Key Applications
Certain key applications for the DektakXT™ Stylus Profiler are:
- Thin film inspection – ensuring high yield
- Surface roughness verification – assuring performance
- Solar trace analysis – reducing manufacturing costs
- Microfluidics – Verifying design and performance