So what makes the S1 TURBOSD handheld XRF such an important innovation in this field? The key is the XFlash® Silicon Drift Detector, which offers count rates and resolution far superior to traditional SiPIN detector technology. This makes for even faster analysis – one second for grade identification, two to three seconds for assay. That’s about five times faster than previous generations.
Not only that, but the improved resolution and count rate of the S1 TURBOSD means lower detection limits for all elements analyzed. Combine that with an extensive grade library and you have one of the most powerful handheld analyzers currently available on the market.
The benefits at a glance The first ever SDD-based handheld analyzer
Superior count rates and resolution
Five times faster than previous generations
Lower detection limits
Grade library covers low alloy steel, tool steel, stainless steel, nickel alloys, cobalt alloys, copper alloys, aluminum alloys, titanium alloys, zirconium alloys and tungsten alloys
Easy analysis of light elements, such as magnesium, aluminum and silicon, without the need for vacuum or helium atmosphere (S1 TURBOSD LE only)
Clarity and usability
We believe the best technology should be intuitive and instinctive to use. Every element of the S1 TURBOSD has been designed with this in mind. The bright display makes it easy to read in any lighting conditions. The touch screen means you can operate the whole machine with one finger, whether inputting a password or pulling the trigger. The operating system is Microsoft Windows® – so well known that it’s almost universal. Data transfer options include Microsoft ActivSync® via USB cable or wireless Bluetooth connection, as well as using an SD card. Built-in memory also makes it possible to store thousands of spectra and millions of results safely.