The ZSX Primus IV from Rigaku is a high-performance wavelength dispersive X-ray fluorescence (WDXRF) spectrometer. The tube-above sequential WDXRF instrument provides a fast and efficient quantitative analysis of minor and major atomic elements. A variety of elements, from beryllium (Be) to uranium (U), can be analyzed in a range of sample types, with minimal standards.
ZSX Guidance software provides support in all aspects of measurement and data analysis. The know-how of skilled experts and built-n XRF expertise takes care of the sophisticated settings, so now accurate analysis can be performed by users who don't have to be experts.
Users can simply add basic data regarding samples, standard composition, and analysis components. Parameters like optimum backgrounds, measured lines with the least overlap, and correction are set automatically with the help of qualitative spectra.
Tube Above Optics for Superior Reliability
The new optics-above configuration integrated into the ZSX Primus IV prevents tedious cleaning and boosts uptime. Operators would no longer have to worry about downtime or a contaminated beam path owing to the maintenance of the sample chamber.
Low-Z Performance with Mapping and Multi-Spot Analysis
The ZSX Primus IV is equipped with a 30 µm tube to allow excellent light element (low-Z) detection limits, the thinnest end-window tube on the market. A sophisticated mapping package is integrated into the instrument to detect homogeneity and inclusions. A multi-spot analysis feature helps to prevent sampling errors associated with inhomogeneous materials.
SQX Fundamental Parameters with EZ-Scan Software
With the help of the EZ-scan software, users can study samples of unknown origin without any need for prior setup. This feature saves a considerable amount of time, allowing users to enter a sample name with just a few clicks of the mouse. Highly accurate and fast XRF results are obtained, thanks to the integrated SQX fundamental parameters software. This software automatically corrects for matrix effects, secondary excitation effect caused by photoelectrons, impurities, fluctuating atmospheres, and varied sample sizes. The combination of matching library and scan analysis programs provide excellent accuracy.
Key Features
The main features of the ZSX Primus IV are as follows:
- ZSX Guidance expert system software
- EZ analysis interface for regular measurements
- Analysis of elements from Be to U
- Digital multi-channel analyzer (D-MCA)
- Tube above optics reduces contamination issues
- Microanalysis to analyze samples measuring down to 500 µm
- Small footprint uses less lab space
- The mapping feature is provided for elemental topography/distribution
- Helium seal ensures that optics remains under constant vacuum conditions
- 30 µ tube provides excellent light element performance
Analysis of Standard Metal Alloys
In the United States, all industries control their production and manufacturing of goods to ensure high quality and precision. One optimum way to control an industrial process is to implement a quality control quantitative calibration with a wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, like the ZSX Primus II spectrometer from Rigaku.
An accurately determined analytical technique in a WDXRF quantitative calibration is optimized for the material being studied with different reference standards. In case certified reference materials are unavailable to configure a quantitative calibration technique, the Rigaku ZSX software provides a standardless quantitative or semi-quantitative assessment that can be utilized for quality control and differentiation of product types.
The Rigaku Primus II was used to obtain data on three varied certified reference materials: Ult1233 (64B) is a cobalt alloy standard; B.S. T-22 is titanium alloy standard, and Inco 690 (201A) is a nickel alloy standard. The data is shown in the following table:
Table 1. Analyzed Brammer metal alloy standards
| B.S. T-22 |
Analyzed |
Std. Value |
Ult1233 (64B) |
Analyzed |
Std. Value |
Inco690 (201A) |
Analyzed |
Std. Value |
| Al |
0.090 |
0.004 |
Al |
0.149 |
0.120 |
Na |
0.036 |
N/A |
| Si |
0.024 |
0.020 |
Si |
0.242 |
0.270 |
Al> |
0.386 |
0.370 |
| Ti |
92.795 |
93.820 |
K |
0.004 |
N/A |
Si |
0.134 |
0.150 |
| V |
0.425 |
0.510er> |
Ti |
0.010 |
0.110 |
P |
0.003 |
0.005 |
| Cr |
1.372 |
1.220 |
V |
0.017 |
0.014 |
S |
0.001 |
N/A |
| Mn |
2.211 |
2.020 |
Cr |
26.139 |
25.620 |
K |
0.006 |
N/A |
| Fe |
1.253 |
1.190 |
Mn |
0.827 |
0.790 |
Ti |
0.301 |
0.300 |
| Co |
0.001 |
N/A |
Fe |
3.064 |
3.020 |
V |
0.013 |
0.011 |
| Ni |
0.014 |
0.008 |
Co> |
53.340 |
54.200 |
Cr |
30.503 |
29.900 |
| Cu |
0.053 |
0.040 |
Ni |
9.355 |
9.060 |
Mn |
0.186 |
0.190 |
| As |
0.009 |
N/A |
Cu> |
0.020 |
0.020 |
Fe |
9.097 |
9.090 |
| Zr |
0.008 |
<0.01 |
Zr |
0.007 |
<0.01 |
Ni |
59.301 |
59.900 |
| Mo |
1.202 |
1.150 |
Nb |
0.014 |
0.018 |
Ga |
0.003 |
N/A |
| Sn |
0.022 |
0.019 |
Mo |
4.629 |
4.770 |
Zr |
0.009 |
<0.01 |
| W |
0.522 |
N/A |
Sn |
0.002 |
N/A |
Nb |
0.007 |
0.009 |
| |
|
|
W |
2.183 |
2.120 |
Mo |
0.015 |
0.018 |
As shown by the data, quality materials can be characterized by using the Rigaku SQX software on a variety of metallic alloy blends. When certified reference materials are not available to create a quantitative calibration for industrial quality control, the Rigaku SQX software serves as an exceptional screening tool to study a wide range of materials.
Rigaku ZSX Primus Series WDXRF spectrometers