There are many reasons why the Tracer
family of portable XRF Instruments has become the preferred instrument for
leading conservation scientists around the world. It combines the power and
flexibility you would expect from a bench-top instrument with the convenience
of a handheld – thanks to some pioneering, user-oriented innovations.
These include the same vacuum technology that we originally developed in partnership
with NASA for the space shuttle program. The instrument also comes with powerful
laptop-based analytical software, live-time spectral display, and customizable
filters and secondary targets, designed to optimize your analysis no matter
what the application.
The Tracer
XRF analyzers allow complete user control of the excitation conditions -
current, voltage and user selected filter for optimization of measurement conditions
for investigation of your objects. The
Tracer III-SD incorporates the proprietary X-Flash® Silicon Drift Detector
(SDD) which provides high speed data acquisition, better resolution than the
traditional SiPIN detector and light element sensitivity. When the Tracer
III-SD is operated with the optional vacuum system the ultimate light element
sensitivity can be achieved.
In addition to the basic instrument the system is supplied with: 1) powerful
lap-top based analytical software which provides live spectral display and complete
peak identification; 2) a tripod mount which allows precise three dimensional
positioning of the analyzer and 3) unmatched application training and support.
The benefits at a glance
- The capabilities of a bench-top instrument, with the convenience of a handheld
- Powerful laptop-based analytical software
- Customizable filters and secondary targets to optimize analysis
- Live-time spectral display
- Vacuum technology developed in partnership with NASA for the space shuttle
program
- Standard package includes 360° tripod
- Proprietary X-FLASH® SDD technology (Tracer III-SD and IV-SD only)
- Unmatched training and support