High-Performance User-Friendly AFM for Materials Research, Life Sciences and Nanotechnology
The alpha300
A integrates an AFM system with a scientific grade optical microscope for
superior optical access and high-resolution sample survey. The inclusion of
a special AFM objective allows simultaneous cantilever and sample observation,
which provides precise cantilever positioning and rapid alignment. The user-friendliness
and versatility of this composite system can benefit an enormous variety of
scientific endeavors.
The WITec AFM-Objective allows high resolution and simultaneous sample and
cantilever view from the top. All standard AFM modes are supported, assuring
the highest flexibility throughout the full range of AFM applications. Whether
you work in air or liquid environments, or even with delicate and soft samples,
the alpha300
A is ideally suited to the investigation of topographic structures at the
highest resolution. For high-performance materials research imaging tasks, the
alpha300
A can be equipped with the Pulsed Force Mode, allowing local surface properties
such as local adhesion or stiffness to be imaged along with topography on the
nanometer scale.