WITec's new True
Surface Microscopy option (patent pending) allows confocal Raman imaging
guided by surface topography. Confocal microscopy is often desirable due to
its suppression of out-of-focus light but can be challenging when analyzing
large or rough surfaces. In these cases, only those points that are in focus
contribute to the image.
Microscopy follows the surface topography with high precision, so that even
rough or inclined samples always stay in focus. To achieve this unique capability,
the WITec alpha500 series can be equipped with a highly precise sensor for optical
profilometry. The topographic coordinates from the profilometer measurement
are used to perfectly follow the sample surface in confocal Raman imaging mode.
The result is an image revealing chemical properties at the surface of the sample,
even if this surface is rough or inclined.