The JEM-ARM200F, incorporating a spherical aberration corrector for electron optic system as standard, has achieved a scanning transmission image (STEM-HAADF) resolution of 0.08 nm, the highest in the world among the commercial transmission electron microscopes.
World's highest STEM (HAADF) resolution of 0.08 nm guaranteed
The ARM200F, incorporating a spherical aberration corrector for electron optic system as standard and the maximum level of electrical and mechanical stability, has achieved a scanning transmission image (STEM-HAADF) resolution of 0.08 nm, the highest in the world among the commercial transmission electron microscopes.The electron probe, after its aberrations are corrected, features a current density level higher by an order of magnitude than conventional transmission electron microscopes.With this probe finely focused, the ARM200F is capable of atomic level analysis, substantially reducing measurement time and improving throughput.