The HYPERION is the result of over 25 years of experience in FT-IR microscopy. Its superior-quality design, including all mechanical, optical and electronic components offers high stability and consistency. The HYPERION features a number of contrast enhancement tools, a broad range of dedicated objectives and chemical imaging. The HYPERION guarantees convenient, effective and high-sensitivity microanalysis. With its modular design, the HYPERION can be customized to satisfy specific requirements. It can be used for a wide range of applications including polymers characterization, materials and chemicals research, art conservation, forensics and life sciences.
Sensitivity, Lateral Resolution
Refraction of the incident light is the only factor that limits the lateral resolution power. A significantly high-sensitivity is reached thanks to the high light-throughput.
The HYPERION infrared beam path is confocal. Apertures can be arranged in conjugate image planes individually, before and after the sample in transmission as well as in reflection. In the standard configuration, the HYPERION has a single transparent knife-edge aperture. Iris apertures, metal knife-edge apertures and aperture wheels are offered along with software controlled and automatic knife-edge apertures.
For FT-IR microscopic analysis in transmission, the samples must be optically thin and have to be normally cut in sections about 5-15 μm thick. Samples can also be measured in reflection and in this case they are deposited on reflective substrates. A standard 15x objective is normally used, alternatively 20x or 36x objectives are available for smaller samples. For non-reflective or non-transparent samples, test measurements can be performed using the attenuated total reflection (ATR) mode.
The dedicated ATR-objective (20x) for the HYPERION integrates a visual sample inspection without restrictions and with the highest sensitivity of the IR measurement. A large number of pressures can be selected at the ATR objective to deal with any kind of sample, from soft to very hard. The internal pressure sensor repeatably ensures optimal contact between the crystal and the sample even during automated ATR mapping measurements.
The measurement of highly thin coatings on metallic surfaces can be achieved using the grazing angle incidence reflection method that improves the interaction of the infrared light with the sample. With its patented design, Bruker grazing angle objective (GAO) attains a very high sensitivity that even enables the testing of mono-molecular layers. Furthermore, measurements with polarized light are possible.
The spectral range of the HYPERION can be extended from the middle infrared to the near infared (NIR), to the visible (VIS), up to 25,000 cm-1 and down to the far infrared (FIR, to 80 cm-1). To cover this extremely broad spectral range, several detectors are available and can be easily exchanged by the user. The HYPERION can have up to two detectors working in parallel, where the switching between positions is controlled by the software.
The HYPERION is controlled by the OPUS which is an all-in, powerful and easy-to-use spectroscopy software. It includes the most detailed collection of data acquisition, processing and evaluation functions. The software user interface can be customized for routine laboratory analysis as well as for advanced R&D applications.
In order to ensure data integrity and straightforward data manipulation, all visual images, resultant spectra, IR images, PCA and RGB plots and annotations are stored in a single file.
Data acquisition using the HYPERION is extremely simple thanks to the attractive wizards (OPUS 7.0). Several univariate and multivariate algorithms are implemented in OPUS to extract the required information from the measured single or three-dimensional data. Resulting IR images can be showed in different 2D and 3D perspectives, on top or beside the visible image.
The HYPERION FT-IR microscope guarantees high-consistency of the measured data. The PerformanceGuard of the spectrometer includes permanent online diagnostics, "real-time" display of the instrument status and integrated automatic instrument tests (OQ, PQ). The OPUS software offers all options to perform the FT-IR-analysis following the GMP- and 21CFR-Part11-guidelines.
The HYPERION Series is a completely upgradeable microscope platform for sophisticated optical and infrared analysis. The HYPERION 2000 includes all features found on the 1000 as does the 3000 with respect to the 2000. The following is a summary of the main features of the HYPERION series:
HYPERION 1000. High performance infrared microscope with reflection and transmission capabilities, transparent knife-edge aperture and manual xy-stage. It has a nose piece with 15x cassegrain and 4x vis objective along with binocular and video viewing.
HYPERION 2000. Fully automated microscope having a motorized stage and an additional LCD screen on the microscope frame. All features of the HYPERION 1000 included.
HYPERION 3000. Fully automated FT-IR imaging microscope with modern focal plane array detector technology. The system includes also all features of the HYPERION 2000.