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Automated Feature and Particle Analysis System Gets New Image Acquisition Hardware

Automated Feature and Particle Analysis System Gets New Image Acquisition Hardware

Maximize The Performance of Your TEM with the X-Max Large Area Silicon Drift Detector

Maximize The Performance of Your TEM with the X-Max Large Area Silicon Drift Detector

Important Revision for the Standard for Measuring the Particle Size of Nanomaterials

Important Revision for the Standard for Measuring the Particle Size of Nanomaterials

Carbon Nanotubes Used in New Low Cost X-Ray Tubes

Using Image Analysis to Validate Particle Sizes of Porous Silica HPLC Media

Using Image Analysis to Validate Particle Sizes of Porous Silica HPLC Media

Nanoscale Detectors for Weighing Single Atoms get a Step Closer

How Much Influence Does a Single Electron Have on a Vibrating Carbon Nanotube

How Much Influence Does a Single Electron Have on a Vibrating Carbon Nanotube

New High-Precision Spring-Testing Instrument from Zwick

New High-Precision Spring-Testing Instrument from Zwick

New Shimadzu Universal Testing Machines Provide Efficient Precise Results for Polymer Testing

New Shimadzu Universal Testing Machines Provide Efficient Precise Results for Polymer Testing

US DOE Award Contract for FTIR NDT Tools for Semiconductors

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