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Major Asian Customer Places Order for Nova's Through-Silicon-Via Metrology Solution

Major Asian Customer Places Order for Nova's Through-Silicon-Via Metrology Solution

Nova Measuring Instruments, a leading innovator and a key provider of optical metrology solutions for advanced process control used in semiconductor manufacturing, announced today that a major customer in Asia placed an order for its Through-Silicon-Via (TSV) metrology solution. This is the first order from this customer for Nova's TSV stand-alone metrology solution. [More]
SEMICON West 2014: Teradyne to Showcase Mobile Technology Test Solutions

SEMICON West 2014: Teradyne to Showcase Mobile Technology Test Solutions

Teradyne, Inc. will showcase mobile technology test solutions in booth #5768 at SEMICON West 2014 held in San Francisco on July 8-10. From mobile processors and wireless to memory and power management, today's mobile electronics are complex devices and Teradyne has the equipment to test them. [More]
New Grade of High-Purity Laboratory Acids Optimized for Trace Metal Analysis from Avantor

New Grade of High-Purity Laboratory Acids Optimized for Trace Metal Analysis from Avantor

Avantor™ Performance Materials, a global manufacturer of performance materials and chemicals, has launched a new grade of high-purity laboratory acids optimized for trace metal analysis and designed to meet the needs of customers in environmental, food, quality control and other testing applications. [More]
New Magnum V Scalable Solution for Massively Parallel Memory Testing

New Magnum V Scalable Solution for Massively Parallel Memory Testing

Teradyne, Inc. announces the Magnum V, the next generation memory test solution in the Nextest Magnum product line designed for massively parallel memory test in the Flash, DRAM and multi chip package (MCP) marketplace. [More]
SEMICON West: FormFactor to Discuss Newest Wafer Test Technologies

SEMICON West: FormFactor to Discuss Newest Wafer Test Technologies

At SEMICON West this week in San Francisco, executives from FormFactor, Inc. will discuss the company's newest wafer test technologies at a series of events and forums. SEMICON West is the premier annual conference and tradeshow for the global semiconductor manufacturing industry. [More]
Jordan Valley Semiconductors Adds Another Customer in Advanced Wafer Level Packaging

Jordan Valley Semiconductors Adds Another Customer in Advanced Wafer Level Packaging

Jordan Valley Semiconductors Ltd., a leading supplier of X-ray based metrology tools for advanced semiconductor manufacturing lines, today announced that its micro-spot X-ray Fluorescence (µXRF) metrology tool has been qualified for production monitoring of advanced Wafer Level Packaging (WLP) processes, by another leading memory player. [More]
Cincinnati Sub-Zero Introduces New Stability Chambers for ICH Q1A Testing

Cincinnati Sub-Zero Introduces New Stability Chambers for ICH Q1A Testing

Cincinnati Sub-Zero’s (CSZ) new StableClimate® II Stability Chambers are ideal for ICH Q1A stability testing, shelf life, package testing, and accelerated aging for a variety of applications including Pharmaceutical Products/Packaging; Medical Products/Packaging; Personal Care Products; Consumer Products and Research. [More]
Hannibal Completes Comparative Impact Testing of TubeRack

Hannibal Completes Comparative Impact Testing of TubeRack

Today, Hannibal Industries Inc. announced that it successfully conducted, completed and recorded the first-ever, side-by-side comparison between standard structural rack and patent-pending TubeRack. [More]
Agilent Introduces Inductively Coupled Plasma – Optical Emission Spectrometer

Agilent Introduces Inductively Coupled Plasma – Optical Emission Spectrometer

Agilent Technologies, Inc. today reinforced its position as an innovator in atomic spectroscopy with the introduction of the Agilent 5100 Inductively Coupled Plasma – Optical Emission Spectrometer (ICP-OES). [More]
Forecast Report on Global Failure Analysis Equipment Market

Forecast Report on Global Failure Analysis Equipment Market

Research and Markets has announced the addition of the "Failure Analysis Equipment Market - Global Industry Analysis, Size, Share, Growth, Trends and Forecast, 2012 - 2019" report to their offering. [More]