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The MicroProf 200 TTV Wafer Measurement System from FRT

The FRT MicroProf 200 TTV Wafer Measurement System uses a unique multisensor technology. The easy to use software allows the user to measure parameters including roughness, film thickness, topography, step height, bow and warp on both sides of a wafer thanks to the the use of sensors above and below the sample.

Run time - 1:13 min

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