AZoM - The A to Z of Materials


 

If you'd like us to help you source a Quotation for this product, please complete the inquiry form with details of your area of interest and we will pass on your inquiry to the relevant person or department within the related company or organisation.

Once submitted, we will try and place you in contact with a suitable supplier within 48 hours.

Why do we go to all this effort on your behalf?

Simple -

What you should know

Well, there's a few conditions that apply;

  • You agree NOT to pay us for this service.
  • We can only process requests where the email address matches the company name, e.g., yourname@yourcompany.com - We cannot respond to free email accounts such as hotmail)
  • You accept that you may be contacted by the supplier in response to your enquiry either by email, phone or mail.
  • You accept that the operators of www.AZoM.com cannot guarantee the suitability of any materials or services you may purchase from a supplier we've contacted on your behalf. You have to check that out with the supplier.
  • You're comfortable with supplying us with relevant information, for example, who you are and where you are based, what you want, how many you want, any delivery deadlines, restrictions on the location of the supplier, any price targets etc etc.
  • We will safeguard your privacy and only pass on the details contained in your email to the relevant supplier or suppliers if you've asked for that.
  • We can't guarantee that the supplier will respond and if they don't, you agree you won't get angry with us.
  • We promise we won't subject you to any follow up spam mail.
  • If you don't receive a response within 10 working days please send us a follow up enquiry and we'll try and help further.
 
 
Saving...
Thank you. Your Inquiry has been Successfully Received, and will be processed by the AZoM RFQ Team.
Mecmesin - Designers and Manufacturers of Force Measurement, Torque Measurement and Tensile Test Systems
Handheld Thermo Scientific Niton XRF analyzers are engineered for portable elemental analysis
Malvern Morphologi G3 particle characterization system
The New D8 ADVANCE – the 1st truly all-purpose Diffraction Solution for X-ray Powder Diffraction
High precision machining of hard materials, Insaco
Princeton Instruments- Imaging & Spectroscopy Cameras
University of Surrey - Short Courses in Advanced Materials
ADMET universal materials testing machines
Composites Europe - Trade Fair and Forum for Composites, Technology and Applications
Email / Share

Laytec Introduces First Tool to Measure the Exact Surface Temperature of GaN Layers

Posted in | Materials Processing | Materials Testing and Characterisation | New Product | Semiconductor

 


At the International Conference on Nitride Semiconductors (ICNS) in Korea on 18-23 October LayTec presented its latest product: Pyro 400. Unlike conventional infrared pyrometry, which can only detect the susceptor surface temperature under sapphire or SiC wafers, Pyro 400 is the first real solution for measuring the exact surface temperature of GaN layers. The tool performs pyrometry at 400 nm. At this wavelength GaN emits light and makes it possible to measure its temperature.

Pyro 400 linescan measurement of 8x3“ configuration. Dummy wafers with a strong concave bowing (#2, 3, 5, 7) have a different temperature profile than GaN templates with just a slight concave bowing (#4, 5, 8). Blue background marks the gaps between wafers.
Pyro 400 linescan measurement of 8x3“ configuration. Dummy wafers with a strong concave bowing (#2, 3, 5, 7) have a different temperature profile than GaN templates with just a slight concave bowing (#4, 5, 8). Blue background marks the gaps between wafers.

At the ICNS Dr. Kolja Haberland of LayTec presented the results obtained during growth of GaN LED structures containing multi quantum wells (MQW). The Figure shows a typical linescan measurement: Pyro 400 monitoring the wafer temperature profile during a full revolution of the susceptor. The data provides direct access to the GaN temperature distribution across each wafer in a planetry reactor. Together with the complementary reflectance and curvature data measured by EpiCurve®, the in-situ measurements give all important information needed to optimize uniformity and LED performance. The data clearly shows that wafer bowing causes changes in temperature distribution and proves that the center of concave bowed wafers is hotter.

Dr. Haberland also reported that the real surface temperature of GaN is sensitive to changes of carrier gas, rotation speed, and reactor pressure. These deviations can not be detected by conventional infrared pyrometry measurements at all. Additionally to these advantages, there are no emissivity oscillations during GaN buffer growth, which makes Pyro 400 an ideal tool for temperature feed-back control application. In summary, Pyro 400 provides a new quality of temperature measurement with an unrivalled accuracy and will be of huge benefit in GaN based LED and laser production in the near future. Our results were also presented at LayTec in-situ seminar held in conjunction with the ICNS. You can download the Pyro 400 talk as well as all other talks hold at the seminar on LayTec website: www.laytec.de/compounds-presentations.html

Posted Nov 15, 2009

Related News


 

Tab options

 

AZoM News Archive Page

9770425302
CILAS state of the art laser particle size analyzers
Particle Sizers from Brookhaven Instruments
Bruker Handheld XRF Spectrometers
Materials Science & Technology 2010 Conference & Exhibition
Metals and Materials for Research - Goodfellow
NanoTest™, the complete nanomechanical testing center
Shimadzu - Energy Dispersive X-Ray Analysis Instruments
Dynamic Ceramic a UK based manufacturer and supplier of Ceramic Components. The UK's leading specialist producer of zirconia, alumina and other advanced ceramics.
Aluminium 2010 - No.1 Aluminium event worldwide

 

AZoM™ - The A to Z of Materials and AZojomo - The "AZo Journal of Materials Online"...AZoM™.com Pty.Ltd Copyright © 2000-2010