Agilent Technologies Inc. (NYSE:A) today announced it has launched the Medalist i1000D in-circuit test system with digital test capabilities.
The i1000D bridges a growing solution gap between high-functionality in-circuit testers and low-end manufacturing defects analyzers.
Designed for cost-sensitive manufacturers looking for a solution with both analog and digital capabilities to tackle today's more complex printed circuit board assemblies (PCBAs), the i1000D offers:
- per pin programmability;
- digital PCF/VCL library-based testing;
- native boundary scan capabilities;
- I2C/SPI serial programming;
- simple, low-cost long-wired test fixture; and
- flexible, easy-to-use graphical user interface.
These features present an excellent opportunity for customers looking for better test coverage without increasing the cost of test.
"With the increasing number of high-speed and digital devices packed onto ever-shrinking PCBAs, our customers find that Agilent's pioneer generation of TestJet technology, which is deployed on most MDAs, no longer provides enough test capabilities," said Daniel Mak, vice president and general manager of Agilent's Measurement Systems Division.
"We believe the way forward is to give customers a powerful solution that can meet their test and cost needs. With the i1000D, we've packed Agilent's latest award-winning innovations into a single affordable system for manufacturers operating in the high-volume and cost-sensitive arena."
The i1000D comes with full native boundary scan test capabilities and Agilent's latest VTEP v2.0 Powered vectorless test suite, which offers the latest award-winning Cover-Extend Technology. Details about the tools in this suite can be found at www.agilent.com/see/vtep .
Visitors to the Nepcon Shanghai 2009 tradeshow, April 21-24, can come to the Agilent booth, No. 4F12, to experience firsthand the digital test capabilities of the Medalist i1000D.
The Medalist i1000D ICT starts shipping in the third quarter of calendar year 2009.