Site Sponsors
  • Goodfellow - Metals and Materials for Research and Industry
  • Tornado Spectral HyperFlux-532 Optical Spectrometer Package with 40% Discount
  • Handheld Thermo Scientific Niton XRF analyzers are engineered for portable elemental analysis
Site Sponsors

LayTec Sell First EpiCurveTriple TT Metrology System to LED Manufacturer

Published on April 20, 2010 at 8:10 PM

LayTec is proud to announce the sale of an EpiCurveTriple TT to a leading LED manufacturer in the USA. The in-situ system will be used for GaN LED production in a multiple-ring MOCVD reactor. The unique combination of a Curve optical head for wafer bowing control and 3 EpiTT heads for temperature and reflectance measurements will be the first metrology system of this kind.

First edition of EpiTriple TT (without Curve® optical head) installed on a CCS reactor

EpiCurveTriple TT is specially designed for application in huge showerhead MOCVD reactors like CRIUS for GaN LED production and GaN/Si applications. Like in LayTec's EpiTriple TT, the three EpiTT heads of EpiCurveTriple TT measure reflectance and emissivity-corrected pyrometry at 3 different radial positions and enable an absolute temperature control of the grow on all heating zones of the succeptor. The accuracy of the temperature measurement after calibration by LayTec's new AbsoluT tool is better than ±1 K. The online growth-rate analysis with the accuracy up to ±0.001nm/s is, of course, also possible.

Additionally to this, the Curve head is an ideal tool for strain control and wafer bow measurements. It helps to minimize bowing-related non-uniformities in GaN LED production on 4" and larger wafers.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Submit