Written by AZoM
FEI Company (NASDAQ: FEIC), a leading instrumentation company providing electron microscope systems for applications across many industries, announces the availability of "An Introduction to Electron Microscopy," an all-new edition of its well-known primer about electron and ion beam microscopy.
The booklet can be downloaded for free at www.fei.com.
The 40-page booklet is ideal for a student or business professional who would like a view into the world of nanotechnology.
It contains a general overview of electron and ion beam microscopes, including the history, technology, terminology and applications of transmission electron, scanning electron, scanning transmission electron, focused ion beam and DualBeam systems.
Image examples cover a variety of samples, such as pollen, semiconductors, steel, minerals, blood cells, viruses, and more.