Lake Shore Cryotronics Introduce the 8400 Series Hall Effect Measurement System

Lake Shore Cryotronics, Inc., manufacturers of scientific sensors, instruments, and systems for precise measurement and control, is pleased to introduce the new 8400 Series Hall effect measurement system (HMS), developed in collaboration with Toyo Corporation of Japan.

The 8400 Series HMS features optional AC field measurement capability that enables measurement of Hall mobilities down to 0.001 cm²/V s - lower than ever possible using traditional DC field Hall measurement techniques. Measurement of low mobilities is highly desirable for contemporary semiconductor and electronic materials being developed for such applications as solar cells, thermoelectric materials, and organic electronics.

Lake Shore's new 8400 Series HMS will be showcased at the American Physical Society's March Meeting, in booth 200, from February 27-March 2, 2012, at the Boston Convention & Exhibition Center Exhibit Hall, in Boston, Massachusetts.

The Model 8404 HMS provides a robust platform to which new features can be added as material measurement needs evolve. The standard system comes equipped with DC field measurement capabilities and a resistance range from 0.5 mΩ to 10 MΩ. The Model 8404 HMS can provide a full range of Hall measurements on van der Pauw samples. An assortment of options, including AC field capability, variable temperature assemblies (15 K to 1273 K), high resistance (up to 200 G), and low resistance (to 10 µ) broaden measurement opportunities and simplify experimental processes.

In the past, the traditional DC field Hall measurement technique has been sufficient to measure materials with mobilities down to approximately 1 cm²/V s. However, the emerging class of photovoltaic (solar cell), thermoelectric and organic electronic materials is characterized by low mobilities that are difficult, if not impossible to measure. The 8400 series HMS uses AC field techniques to extract the diminishingly small Hall voltage from the background noise produced by these new materials, and closes the gap between traditional DC field measurement techniques and these low mobility materials.