Aehr Test Systems, a worldwide supplier of semiconductor test and burn-in equipment, announced today that it has received a significant order from a leading semiconductor manufacturer for development of a next generation FOX-1 system. The system development is expected to complete in calendar year 2013.
"We believe it is very significant that this customer is working with us to develop our next generation FOX-1 system," said Carl Buck, vice president of marketing at Aehr Test Systems. "This new FOX system is designed to provide the customer with increased test flexibility and capability at a significantly lower cost of test than alternative solutions while also expanding the markets addressed by our FOX full wafer test products."
The FOX-1 full wafer parallel test system has the capability to test thousands of die in a single touchdown, thus providing a cost-effective solution for devices with long test times such as flash and microcontrollers with embedded flash. Other members of Aehr Test's FOX family of products are focused on long-duration full wafer burn-in and test of products such as automotive ICs, MCUs, DRAMs and VCSELs (laser diodes).