Posted in | News | Materials Testing

EVT Releases EyeVision Image Processing Software for Thread Inspection

The EyeVision image processing software by EVT can now also inspect defects on threads. Male as well as female threads. The images are best captured with a super wide angle lens, in case of female threads.

Thread Inspection NIO

The evaluation is carried out automatically with the EyeVision inspection program. It inspects if the thread is complete and detects damages and flaws.

The EyeVision software detects therefore if the thread is too wide or too narrow. Its thickness is evaluated and saved. Gaps or openings are also detected. Only if the gap is bigger than 160 pixel, the inspection is discontinued. Otherwise the gaps can be skipped, after the gap width is recorded and saved by the software

The bend of the thread is also trailed and therefore it is possible, that after a gap the detection of the thread is continued automatically by the inspection program.

The additional binary filter makes it also possible, that too dark or too bright parts of the image are evenly spread and the contrast diminished.

The inspection programs are created via the drag-and-drop function of graphical user interface of the EyeVision software. No programming skills are necessary.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Your comment type
Submit

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.