Aug 25 2016
Shimadzu Scientific Instruments (SSI) announces the release of the AIM-9000 infrared microscope. With automated analysis functions and an enhanced wide field camera option, the microscope enables analysts of all experience levels to observe, measure, and analyze micro samples quickly and efficiently. Laboratories can use this microscope system to perform high-sensitivity analysis in fields such as electrical/electronics, forensics, pharmaceuticals, life science, foods, and chemicals.
With a 330X digital zoom “view to scan” feature, the AIM-9000 infrared microscope system provides analysts with an easier and more efficient tool for finding and positioning microscopic samples for accurate analysis. In addition to observing large areas up to 10x13 mm, analysts can use the wide field camera and microscope camera together to zoom and position areas as small as 30x40 μm without loss or repositioning of the sample. The microscope’s best-in-class 30,000:1 signal-to-noise ratio allows users to obtain excellent spectra from even the smallest contaminants for more accurate library matching and identification.
The AIM-9000 microscope features automatic contaminant recognition and registration, making the system ideal for contaminant analysis. Analysts simply click one button and the software automatically selects potential areas for analysis and suggests optimal aperture sizes and angles, all in only one second. The user can then select all for analysis, select none, or add their own manually with a mouse click-and-drag operation. All selected sample images are saved into the measured spectral file automatically. Proprietary spectral identification programming uses both library scans and key spectral features to rapidly match spectra and provide identification with reporting.
With convenience and functionality in mind, Shimadzu has equipped the AIM-9000 infrared microscope system with a visible/infrared dual view system. This allows users to measure infrared spectra while simultaneously checking a visible image of the sample. This provides for more confident measurements while decreasing overall measurement time. Analysts can also use the high-speed mapping program, which captures microscope images and quickly synthesizes them to create visual images for large areas.
The AIM-9000 microscope system is supported by a large array of accessories. These include a variety of ATR options, a TGS detector for extended wavelength range or for operation when liquid nitrogen is not available, and visible and infrared polarizers for examining oriented samples.
For more information on Shimadzu’s AIM-9000 infrared microscope system, go to http://www.ssi.shimadzu.com/products/product.cfm?product=ftir_aim9000.