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Atomic Force Microscopy in the Detection of Changes in Cell Morphology of Mutant Huntingtin Using BioScope II AFM from Veeco Instruments

The high resolution imaging capability of AFM has recently facilitated the construction of atomic models of supramolecular assemblies from topographical images of photosynthetic proteins and channel...

http://www.azom.com/article.aspx?ArticleID=4773 | 22 Jun 2009
Atomic Force Microscopy - Characterizing the Interaction Between Dopamine and the D1-Receptor with BioScope II AFM from Veeco Instruments

In the present study we used a Veeco Bioscope II atomic force microscope (AFM) to investigate the potential application of force measurements in monitoring the response and binding properties of...

http://www.azom.com/article.aspx?ArticleID=4774 | 22 Jun 2009
Imaging DNA-Based Materials Using Atomic Force (AFM) and Scanning Probe (SPM) Microscopy by NT-MDT

With the increasing popularity of DNA- and RNA-based materials, the ability to accurately and repeatably mesure and image these materials is of higher importance. Aspects such as probe radius,...

http://www.azom.com/article.aspx?ArticleID=4077 | 14 Feb 2008
Nanoscale Thermal Analysis of Polymers Using Atomic Force Microscopy (AFM)

Nanoscale thermal analysis (nTA), a novel technique that allows the determination of the local transition temperature on the surface of a material with nanoscale spatial resolution. NTA can help...

http://www.azom.com/article.aspx?ArticleID=4776 | 22 Jun 2009
WITec Atomic Force Microscopy (AFM) - One of the Most Powerful Methods Available for Surface Characterization by WITec

Atomic force microscopy (AFM) is one of the most powerful methods available for surface characterisation. The forces which interact between tip and sample can be used to map surface topography on the...

http://www.azom.com/article.aspx?ArticleID=3964 | 9 Nov 2007
Atomic Force Microscopy - Features of AFM in High-Resolution Medical Nano-Imaging

In this application note, we demonstrate the utility of AFM in delineating the cause of cataracts. High-resolution imaging of native lens membranes and the constitutive protein components was achieved...

http://www.azom.com/article.aspx?ArticleID=4775 | 22 Jun 2009
Conductive Atomic Force Microscopy ( AFM ) – Characterizing Conductivity Variations in Resistive Samples by Asylum Research

Conductive AFM is a powerful current sensing technique for characterizing conductivity variations in resistive samples. It can simultaneously map the topography and current distribution of a sample.

http://www.azom.com/article.aspx?ArticleID=3510 | 25 Jul 2006
Surface Profiling - Dektak Surface Profilers in Three-Dimensional Surface Profiling Analysis

This application note describes the advantages of 3D measurement options available through a combination of Bruker's Dektak Stylus Profiler and Vision analysis software.

http://www.azom.com/article.aspx?ArticleID=4779 | 25 Jun 2009
Automatic Step Detection - Automatic Step Measurement with Dektak Surface Profilers

Dektak stylus profilers provide accurate step height measurements from several nanometers through hundreds of microns, with repeatability down to 7.5 Angstroms.

http://www.azom.com/article.aspx?ArticleID=4777 | 25 Jun 2009
Piezo Response Imaging— A Crosspoint Switch Example Using the MFP-3D Atomic Force Microscope ( AFM ) from Asylum Research

Using piezo response imaging, the MFP-3D AFM from Ayslum research is able to characterise the electrival properties of materials on the nanoscale level as well and provide topographical information.

http://www.azom.com/article.aspx?ArticleID=3512 | 26 Jul 2006

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