Maximum Concentration Limit for Size 40% w/v with the Zetasizer Nano Range

The maximum concentration specification for the Zetasizer Nano S or ZS instrument to measure size is 40% w/v. This article includes details of the experimental procedures and results achieved from measurements of a nominally 100 nm silica suspension at a concentration of 40% w/v to demonstrate this maximum concentration limit.

Experiment

Materials

  • DTS0012 disposable sizing cuvettes
  • 40% w/v colloidal silica suspension with a nominal size of 100 nm

Method

The 40% w/v silica suspension was first placed into a DTS0012 disposable sizing cuvette, taking care to make sure that air bubbles were not present. The measurements were then taken at a temperature of 25 °C.

Results

Figure 1 illustrates the intensity size distributions obtained from 5 repeat measurements of a nominally 100 nm silica suspension at a concentration of 40% w/v, representing the repeatability of measurement at this concentration.

Intensity size distributions obtained from 5 repeat measurements of a nominally 100 nm silica suspension at a concentration of 40%

Figure 1. Intensity size distributions obtained from 5 repeat measurements of a nominally 100 nm silica suspension at a concentration of 40%.

 

Figure 2 is an overplot of the correlation functions of these measurements, illustrating an exceptional repeatability and an intercept of 0.77 signifying a good signal and a low probability of multiple scattering which would have an effect on the size measured.

Correlation functions obtained from 5 repeat measurements of a nominally 100 nm silica suspension at a concentration of 40%.

Figure 2. Correlation functions obtained from 5 repeat measurements of a nominally 100 nm silica suspension at a concentration of 40%.

Conclusions

The results reported in this article prove that the maximum concentration specification for size measurements on the Zetasizer Nano S or ZS instrument is 40% w/v.

This information has been sourced, reviewed and adapted from materials provided by Micromeritics Instrument Corporation.

For more information on this source, please visit Micromeritics Instrument Corporation.

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