Optical Emission Spectrometry (OES) in Metallurgy Supported by LIMS Software

Optical emission spectrometry is one of the most reliable and popular analytical methods for determining the chemical composition of metallurgical elements. [FP]-LIMS is the LIMS software solution designed by Fink & Partner GmbH. In this article, this laboratory software will be analyzed, and how it provides reliable and quick evaluation and sample tracking discussed.  

Optical emission spectrometry (OES) is a universally recognized analytical technique used to determine the chemical composition of metal alloys. The chemical elements must be analyzed and collected for the creation of an accurate report.

OES is the solution to quick, reliable, and simple mass test methods in metallurgical production and quality assurance.  

It can also be assumed that a large amount of data and samples are involved with OES. Hence, OES is a measurement method that could benefit from the support of LIMS software.

According to Bengtson (2017), OES analysis is the most popularly used method in the field of metallurgical samples since the mid-1960s. This article will discuss how an OES analysis can be supported by LIMS software in the metallurgical application field.  

Laboratory information management system (LIMS) optimizes data collection, evaluation, and archiving and increases reliability when determining the chemical composition of metal alloys.

OES is an analysis technique that uses a high energy discharge created in the gas-containing space between a sample of the testing material and an electrode.

OES analysis is rooted in the spontaneous emission of photons from atoms and ions that have been excited in a radiofrequency discharge, according to Hou and Jones.

This process begins when electrical energy is generated between an electrode and a metal sample in the form of a spark. This energy is applied to the vaporized atoms and brought to a high energy state within a so-called "discharge plasma".

The plasma is ignited into an argon atmosphere between a copper or silver electrode and an analyte particle. The sample that reaches the plasma is quickly dried and collides through excitation at a high temperature. Analyte elements then become gaseous free atoms.

Additional energy is needed for further excitation of the atoms within the plasma. OES analysis benefits from a higher atomization temperature and the capability of providing simultaneous determinations for up to 70 elements.

Taking this into consideration, it can be asserted that the analyses will always produce many samples and data, which must be collected, tracked, evaluated, and archived.  

LIMS software can have an important role in OES analysis. Nowadays, laboratories have high-standard-requirements and suitable software support is an investment that a company should not underestimate.

After setting up an OES analysis,  accurate and clear samples and data collection and evaluation are necessary. In general, LIMS software is designed to guarantee all of this whilst achieving reports creation at the same time. [FP]-LIMS is the combination of the three ground-features of accuracy, user-friendliness, and simplicity.

An OES analysis also involves many measurement instruments whose data have to be imported into the system in order to be analyzed. As well as [FP]-LIMS meeting these requirements, it is compatible with many lab equipment manufacturers and connects with many measurement instruments.

In conclusion, OES can be considered to be the most reliable and common analysis for the determination of the chemical composition of metal alloys.

Therefore, OES analysis involves the tracking and evaluation of many data. Taking this into consideration, LIMS software provides a practical solution, enabling reliable and quick data and sample collection, track, and evaluation.

Sources

  • Bengston, A. (2017): Laser Induced Breakdown Spectroscopy compared with conventional plasma optical emission techniques for the analysis of metals – A review of applications and analytical performance. In: Spectrochimica Acta Part B: Atomic Spectroscopy 134, pp. 123-132.
  • Hou, X. and Jones, B. T. (2000): Inductively Coupled Plasma/Optical Emission Spectrometry. In: Encyclopedia of Analytical Chemistry, pp. 9468-9485.


This information has been sourced, reviewed and adapted from materials provided by Fink & Partner GmbH.

For more information on this source, please visit Fink & Partner GmbH.

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