Camtek FRT Metrology and Keysight Technologies have come together to develop an integrated measurement solution for Pre-Screening Qubit Devices that enable quantum system engineers to eradicate wire-bonding and packaging from the cryogenic test process.
Image Credit: Camtek FRT Metrology
Quantum system engineers working at milli-Kelvin temperatures often encounter the complexities and inconveniences of long development cycles. The main factors leading to prolonged and expensive development cycles include:
- Complex fabrication process with numerous additive and subtractive steps necessary to generate a superconducting or spin qubit device
- Time-intensive wire bonding and costly packaging processes before conducting cryogenic test and measurement
- Testing devices at < 15 mK necessitates dilution refrigeration (DR) and prolonged cooldown times of more than 30 hours
- Qubits that fail final deployment as a result of insufficient performance or parameter offsets which require warming up the system and inserting a new device
Camtek FRT Metrology and Keysight Technologies have worked together to develop a combined measurement solution for Pre-Screening Qubit Devices that enable quantum system engineers to eradicate wire-bonding and packaging from cryogenic test processes.
Moreover, the solution will supply essential qubit performance parameters at 50 mK to facilitate smooth deployment in their existing dilution refrigerators at 20 mK to improve the development cycle times two-fold.
The fully optimized joint integrated measurement solution is ideal for qubit pre-characterization applications, which eradicates the time-intensive processes of picking out each individual piece of equipment and manually integrating them. The system transmits initial qubit parameters back to pass/reject devices accurately before the final deployment step in a dilution refrigerator.
One such example of a qubit pre-characterization process on the Model 106 integrated solution was performed by the leading superconducting circuit developer, Seeqc. The company is developing the first digital quantum computing platform for global businesses that, through a novel superconducting chip-scale architecture, supports both classical and quantum technology.
Seeqc has demonstrated the capacity to accelerate its development cycle more than two-fold by pre-characterizing its superconducting devices using the Model 106 Integrated Measurement Solution. The pre-characterization measurements mean that Seeqc can guarantee the best performing devices are employed in the DR.
The pre-characterization measurements on the qubits also allow Seeqc to forward this information to the deployment device, which has reduced the time spent on the setup and calibration of the qubits in the deployment cryostat.
The Camtek FRT Metrology Model 106 integrated measurement solution employs both Keysight’s Labber Quantum software and the Keysight PXI-based quantum control solution to offer a ready-made cryogenic system with rapid-cooldowns at less than 50 mK in around 16 hours.
The system is used to quickly screen and characterize superconducting or spin qubit devices before being put to service.
To learn more about this collaborative development of an integrated measurement solution for sophisticated quantum development, download the brochure – Superconducting and Spin Qubit Pre-Screening (PDF) and watch the webinar.
This information has been sourced, reviewed and adapted from materials provided by Camtek FRT Metrology.
For more information on this source, please visit Camtek FRT Metrology.