NaioAFM - All-in-One Atomic Force Microscope for Small Samples from Nanosurf

Nanosurf offers NaioAFM, an all-in-one atomic force microscope that is specifically designed for small sample measurements and nanoeducation. The high-performance AFM system is easy to handle and affordably-priced. It is compact enough to fit into any place.

Key Features

The product features of the NaioAFM atomic force microscope are:

  • Top view camera of high resolution as well as side view sample observation are integrated
  • Integrated controller, vibration isolation, airflow shielding, and XY-table (12 mm)
  • All standard operating modes are available
  • Easy cantilever exchange: detector or laser adjustment is not needed
  • Easy-to-use software wizards instantly prepare measurement parameters
  • System setup is not required; simply plug into the computer and start the software

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