UNECS-3000A is an advanced, ultra-fast spectroscopic ellipsometer that uses snap shot measurement technique with automated mapping to measure optical and thickness parameters of thin films. The system can be utilized for a variety of applications, ranging from research and development to large-scale production. Users can utilize the instrument to obtain precise measurement results. The UNECS-3000A measures optical parameters and semitransparent or transparent thin film thicknesses on substrates equal to or less than f300 mm.
The main features of the UNECS-3000A are:
- Ultra-fast measurement
- Automated mapping function
- Multilayer measurement
- Customized material tables allow users to edit and add material table files
- Main measurement unit includes laptop PC and data analysis software.
- Excellent cost-performance