Characterization of Nanostructures Via SAXS, GI-SAXS and Nanography - The NANOSTAR from Bruker

The NANOSTAR, with its excellent modularity, is a suitable tool for characterizing nanostructures ranging from 1 nm to 125 nm and nanostructured surfaces by SAXS, GI-SAXS and Nanography. The mirror-conditioned pinhole collimation system offers an increasingly intense, parallel X-ray beam to enable achievement of short measuring times.

The ideal circular beam shape is maintained by the collimation system and is highly effective in eliminating background noise, enabling analysis of very weakly scattering samples and large structures.

Pure sample properties are analyzed by the NANOSTAR even for non-isotropic sample systems. The modular design helps in setting the detector-to-sample distance from 11.5 mm up to 1070 mm. Hence, the entire range from SAXS to WAXS can be covered, in combination with the Image Plate (IP) option simultaneously.

Key Features

The key features of the Bruker's NANOSTAR are:

  • Modular setup for excellent flexibility
  • Brilliant X-ray sources: IµS, TXS and METALJET
  • VÅNTEC-2000, large 2-D detector with true photon counting ability
  • Variable sample-to-detector distance covering a wide q-range
  • MONTEL optics with exchangeable pinhole collimation system for high flux/high resolution
  • Low background collimation system using conventional three-pinhole or new SCATEX two-pinhole setup
  • Large sample chamber accommodating a variety of sample holders

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