The FEI DualBeam 235 Focus Ion Beam (FIB) system offered by TSS Microscopy is a combination of a high-resolution field emission scanning electron microscope and a scanning metal ion beam microscope. The instrument includes detectors that enable SE and BSE imaging as well as secondary ion imaging.
The FEI DualBeam 235 system is a 2003 model and has been refurbished. Worldwide installation is available on this model.
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- High resolution imaging with the S-FEG SEM and UHR detectors
- SE and BSE imaging
- High accuracy milling with the Magnum ion column
- Electron and Ion imaging
- Flexibility and ease of use for FA, QA, R&D and product development
- TSS can custom configure the DB235 for you