Calibration Standard Grids and Meshes for Transmission Electron Microscopy

Agar Scientific specializes in providing a wide range of specimens specifically for TEM calibration where high resolution results or quantification are required.

Agar Scientific calibration specimens for TEM are famous globally for their quality and reliability, and each one undergoes extensive quality checking prior to shipping. Specimens are rejected for exceeding 5% broken grid squares, for excessive dirt, or for inadequate image quality. All specimens are prepared on standard 3.05mm copper grids.

Agar Scientific offers a wide range of TEM calibration grids for different applications. Some of the available grid types include:

  • Shadow cast carbon replicas of diffraction line gratings (spacing 462.9 nm) which are used typically for calibrating electron-optical magnifications up to the x80,000 to x100,000 range.
  • Fine mesh grids available in copper, nickel or gold, in 1000, 1500 and 2000 mesh (1000, 1500 or 2000 repeat distance per inch), ie. 25, 18.75 and 12.5 µm.
  • Negatively stained catalase crystals show lattice plane spacings of approximately 8.75 and 6.85 nm very clearly (using TEM and STEM).
  • Potassium chloroplatinate crystals is a uniform distribution of crystallites thinly dispersed on a 3.05mm grid and exhibits a lattice plane spacing of 0.56 nm.

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