Bruker's VITA technology adds high resolution nanoscale thermal characterization capabilities to Bruker's Dimension® Icon® AFM, Dimension Edge AFM, and MultiMode® 8 SPM.
Now AFM users not only benefit from unmatched core performance, but can add a traditional bulk characterization technique. The VITA: AFM Nanoscale Thermal Analysis Module builds on Bruker's extensive expertise with thermal measurements - providing extended thermal measurement performance through:
- Improved lateral resolution capabilities (to <100 nm)
- Full digital control of heating cycles
- Productive VITA control integration enabled by Bruker systems open architecture
VITA technology provides superior material characterization in two ways:
- Nanoscale Thermal Analysis (nTA)
- Scanning Thermal Microscopy