The Nexview™ 3D optical surface profiler from Zygo can measure topography of almost any surface, from smooth to rough with sub-nanometer accuracy, independent of field of view.
Measurement types comprise roughness, flatness, steep slopes, thin films, large steps and surface topography ranging from < 1nm up to 20000µm in height.
The Nexview™ profiler can measure a super polished optical surface having sub-Angstrom surface roughness, to steep machined angles up to 85 degrees. It offers the best qualities of other profiling technologies such as focus scanning, stylus and confocal without their shortcomings. Users no longer have to choose a profiler based on the type of surface they want to measure.
The Nexview™ profiler also utilizes the all-new Mx™ software that powers system control and data analysis such as quantitative topography information, rich interactive 3D maps, intuitive measurement navigation, pass/fail limits, control charting and built in SPC with statistics.
The main features of the Nexview™ 3D optical surface profiler include:
- Streamlined design
- Automated operation
- No-compromise profiling
- 3D and non-contact measurement
- Vibration tolerance technology
- Gage capable performance
- All new analysis and control software
- Intuitive user interface
- ISO 25178 surface measurement parameters
- All new graphical workflow software