The next generation QUANTAX EDS from Bruker combines slim-line technology with a wide range of active areas for XFlash® 6 detectors. Bruker’s EDS detectors are integrated with enhanced hybrid pulse processor in order to set a new benchmark in functionality and high performance.
XFlash® 6T detectors for TEM and STEM offer minimum mechanical and electromagnetic interference as well as largest solid angle for TEM and S/TEM. They provide optimum take-off angle and avoid the necessity of sample tilt.
Key Features
The main features of the Bruker’s QUANTAX EDS for TEM/STEM include:
XFlash® 6T | 30 – the first SDD for aberration corrected TEM:
- All-rounder for TEM analysis with mid-size 30 mm² chip
XFlash® 6T | 60 – the large solid angle SDD for Å-scale TEM analysis:
- 60 mm² active area detector for analysis under low X-ray yield conditions
ESPRIT 2 analytical software for qualitative and quantitative analysis, quantification routines include:
- Standardless and standard-based Cliff-Lorimer quant
- High accuracy zeta-Factor quant
Applications
The key applications of the Bruker’s QUANTAX EDS for TEM/STEM include:
- Characterizing semiconductor structures
- EDS for life science
- Analysis of magnetic nanostructures
- Investigating core shell particles
- Chemical phase analysis
- Chemical characterization
- Atom column EDS
- Single atom EDS