Octane Silicon Drift Detector Series for TEM from EDAX

EDAX's Octane Silicon Drift Detector (SDD) Series for the Transmission Electron Microscope (TEM) offers the crucial analytical solution for TEM applications. EDAX was the first to launch a windowless SDD, which gives the most favorable light element performance with the full transmission of low energy X-rays.

In comparison to a SUTW detector, the sensitivity of the light element was up to 500% better and the count rate was improved by 30% for heavy elements. Therefore the outcome is the mapping speed and light element recognition in low concentrations are greatly improved with the windowless design.

There are three types of SDD machines. The Octane T Plus is an entry-level SDD with a Super Ultra Thin Window (SUTW) that is also cost-effective. The Octane T Optima is formulated on a column-specific plan providing a windowless detector with solid angles up to 0.5 sr. The Octane T Ultra is a high-performance analytical TEM with solid angles up to 1.1 sr.

Key Features

The following are the features of EDAX’s Octane SDD series for TEM:

  • All electronics are inbuilt to allow remote access, installation, service, and calibration
  • Automated calibration algorithm enables speedy, repeatable, and precise setup
  • TEM quantification algorithm for thin materials is provided in TEAM™ EDS Analysis System
  • Amp times from 120ns to 7.68µs available for optimal collection
  • Compressed detector unit provides versatility for each TEM installation
  • SUTW and windowless detectors are offered for excellent light element performance with resolutions better than 59eV for carbon
  • Speedy Ethernet communication
  • 30 - 100mm2 SDD chip technology optimized for solid angle
  • Peak shift of <1eV up to 250kcps
  • Typical 129eV resolution for manganese
  • Resolution stability of <1eV up to 100kcps
  • Motorized slide automatically retracts in response to unnecessary backscatter electrons.

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