Combined Raman/Atomic Force Microscope (AFM) systems are ideal for the characterization of material properties as they have the potential to reveal information at nanometre scales.
Renishaw’s inVia confocal Raman microscope can be combined or integrated with a broad range of AFMs and other scanning probe microscopes (SPMs), as it provides users with flexible, efficient, and high performance operation.
Renishaw’s combined confocal Raman/AFM systems consist of:
- the inVia Raman microscope
- an AFM/SPM
- direct optical coupling between the inVia and the AFM/SPM
It is possible to combine inVia Raman systems with AFMs on inverted and upright microscopes, and to free standing AFMs, when using an objective-lens-equipped transfer tube. This guarantees compatibility with the broadest AFM range, providing a vast choice of systems and allowing users to ensure they have the system best suited to them.
Combining with an AFM doesn't affect the intrinsic capabilities of the inVia confocal Raman microscope. One can still benefit from inVia’s extensive capabilities and analytical power, such as the choice of excitation wavelengths and ultra-fast StreamLine chemical imaging.
Combined Raman/AFM Systems from Renishaw
inVia integrated with a JPK NanoWizard 3
inVia integrated with a Bruker Nano Surfaces Innova
inVia integrated with NT-MDT Ntegra
inVia integrated with a Bruker Nano Surfaces Bioscope Catalyst
inVia integrated with Nanonics MV2000
Tip-enhanced Raman scattering (TERS) offers chemical imaging at the nanometre scale, enabling research to be taken to new heights. Renishaw has provided a complete range of TERS-ready solutions for over a decade, allowing collection of TERS data from a wide variety of sample types.
With inVia-AFM systems, time can be saved and data acquired quickly. inVia-AFM systems are highly convenient and so one can get both Raman and AFM measurements without moving samples from instrument to instrument, thereby saving a great deal of time for operators.
Renishaw’s direct coupling methods use mirrors, instead of fibre optics which ensures maximum efficiency and hence sensitivity. This allows high quality data to be obtained in the least amount of time.
Choose the Renishaw inVia microscope for Raman analysis
Choose the Renishaw inVia Microscope for Raman Analysis - Video sourced from: YouTube
Confidence in Results
Raman-AFM is highly stable and combining with inVia guarantees excellent results. Renishaw was the first Raman supplier to realize the power of combining Raman spectroscopy and AFM/SPM. In 1999, Renishaw supplied its first combined Raman/AFM system to Chalmers University of Technology, Sweden. Eventually in 2002, these pioneering instruments were awarded with the prestigious Photonics Circle of Excellence prize.
Renishaw’s inVia Raman microscope can be combined with AFMs and SPMs from all the major vendors, including Bruker Nano Surfaces, JPK, Nanonics, NT-MDT, and a variety of others. It is even possible to determine the best way to add inVia’s powerful chemical imaging capabilities to an AFM if you already own one.
What Users Have Said About the inVia System
Direct optical coupling of NTEGRA with the inVia system provides reliability and stability for challenging research with TERS. This, combined with the relative ease of use of the inVia system and the expertise of Renishaw, promotes our confidence in performing these experiments.
Professor Sergei Kazarian at Imperial College London, United Kingdom
inVia-AFM systems are used in a broad range of application areas, including:
- Life sciences
- Novel materials for electronics, display and solar technology
- Quantum dots and nanowires
- Carbon nanotubes and graphene
- Composite materials
- Data storage
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