UV-3600 Plus UV-Vis-NIR Spectrophotometer with Three Detectors

Shimadzu’s UV-3600 Plus UV-Vis-NIR spectrophotometer is built with three detectors and a high-performance double monochromator system so and offers a high level of sensitivity and resolution.

The UV-3600 Plus is the world’s first spectrophotometer to be equipped with three detectors. It is provided with a wide range of wavelengths and a number of optional accessories.

Key Features

The main features of the UV-3600 Plus UV-Vis-NIR spectrophotometer are:

  • High sensitivity - Photomultiplier tube (PMT) is provided for UV and visible regions, and InGaAs and cooled PbS detectors for near-infrared region. Unlike the traditional spectrophotometers, the UV-3600 Plus uses the InGaAs detector to cover the crossover region and ensures high sensitivity across the whole measured wavelength range. It offers a noise level of 0.00003 Abs at 1500nm.
  • High resolution, ultra-low stray-light, and wide wavelength range - A high-performance double monochromator helps acquire an ultra-low stray-light level (0.00005% max. at 340nm) with a high resolution (maximum resolution: 0.1nm). The wide wavelength range of 185 to 3,300nm enables measurement across the UV, visible and near-infrared regions.
  • Wide range of optional accessories - The three-detector multi-purpose large-sample compartment or integrating sphere options assist in performing high-sensitivity measurement of solid samples. The ASR series of absolute specular reflectance accessories can be used to perform high-precision absolute reflectance measurements. Moreover, micro cell holders and temperature-controlled cell holders are provided to handle numerous measurement applications


The UV-3600 Plus UV-Vis-NIR spectrophotometer is applied in:

  • Imaging devices, such as mobile phones, security cameras and digital cameras
  • Nanotechnology
  • Photovoltaics
  • Coatings

Absolute Reflectance Measurement of Mirrors

The performance of lasers, telescopes and few other devices depend on the reflectance of the mirrors used in them. The total light reflected from a sample consists of a diffuse component and a specular component.

The reflectance component of significance in mirrors is the specular component. Furthermore, reflectance can be determined with respect to reflectance of a background material or as absolute. An absolute reflectance measurement (ASR) accessory is used for determining the absolute values of specular reflectance. The results of mirror measurement are shown in the figure below.

Calculation of Band Gap

The band gap measurement is critical for research associated with solar-cell and photocatalytic materials and is the basic physical property of the materials. The diffuse reflectance spectra of three semiconductor materials used in solar cell production with the ISR-603 integrating sphere are given below. The absorption edge and wavelength vary according to the type of sample. This difference denotes the band gap difference in the samples.

Using the Tauc method, the band gaps of the samples were calculated. The values were found to be 1.63ev for GuGaSe2 (red line) 1.27 eV for Culn0.5Ga0.5Se2 (blue line) and 0.99 eV for CuInSe2 (black line).

Sample Band Gap Value
CuGaSe2 1.63 eV (757nm
Culn0.5Ga0.5Se2 1.27 eV (977nm)
CuInSe2 0.99 eV (1253nm)


Variable Angle Reflectance and Transmittance of Thin Film Coatings

The ability for facilitating thin film characterization by variable angle transmission and reflection is critical in the design/development process as well as in the final production. Shimadzu provides two UV-Vis-NIR spectrophotometers and a range of accessories for this purpose, especially the UV-3600Plus featuring the 5-Degree Specular Reflectance stage and the Variable Incident Angle Film Holder (VIAFH) and the SolidSpec-3700 featuring the Absolute Variable Angle Measurement Attachment (VAMA). Using these spectrophotometers and accessories, films can be characterized in the entire spectral wavelength region, from UV to the visible and the near infrared.

Four thin films that are deposited on 25 x 25mm glass substrates are characterized in this experiment. Both spectrophotometer instruments are used to measure transmission at angles of incidence of 0, 5, 15, 30 and 45°. Reflection is quantified at a 5° angle of incidence on the UV-3600 Plus and at the same angles of incidence on the SolidSpec-3700. The acquired spectra are shown in the following images:

Sample 1 - 0 Deg (red), 5 Deg (orange), 15 Deg (green), 30 Deg (Blue), and 45 Deg (violet)

Sample 1 - 0 Deg (red), 5 Deg (orange), 15 Deg (green), 30 Deg (Blue), and 45 Deg (violet)

Sample 2 - 0 Deg (red), 5 Deg (orange), 15 Deg (green), 30 Deg (Blue), and 45 Deg (violet)

Sample 2 - 0 Deg (red), 5 Deg (orange), 15 Deg (green), 30 Deg (Blue), and 45 Deg (violet)

Sample 3 - 0 Deg (red), 5 Deg (orange), 15 Deg (green), 30 Deg (Blue), and 45 Deg (violet)

Sample 3 - 0 Deg (red), 5 Deg (orange), 15 Deg (green), 30 Deg (Blue), and 45 Deg (violet)

Sample 4 - 0 Deg (red), 5 Deg (orange), 15 Deg (green), 30 Deg (Blue), and 45 Deg (violet)

Sample 4 - 0 Deg (red), 5 Deg (orange), 15 Deg (green), 30 Deg (Blue), and 45 Deg (violet)


From the aforementioned spectra, a good correlation can be observed between spectral acquisitions on the two spectrophotometer systems and accessories. The UV-3600 Plus features a monochromator and 3-detector design, which offers higher resolution and superior noise reduction for the entire spectral wavelength range. The absence of an integrating sphere in the detector system enables the UV-3600 Plus to have an extended analytical range to 3300nm with better signal-to-noise ratio.

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