The small spot energy dispersive X-ray fluorescence (ED-XRF) spectrometer has been optimized for compliance testing and also for element line scans and mappings.
- Widest scope of elements backed by widespread factory calibrations offering the best accuracy for majors and traces
- The all-round talent for the non-destructive, fast analysis of small spots and the rapid mapping of huge surfaces
- Fastest measurement times: choose conventional results at exceptional measurement times, or exceptional results at conventional measurement times
- Launched August, 2016
The SPECTRO MIDEX is considered to be an all-round talent for the non-destructive, fast analysis of small spots and the rapid mapping of huge surfaces (up 233 x 160 mm, 9.2 x 6.3’’) in research and development as well is in compliance screening applications as many elemental analysis tasks in research, industry and the sciences need a non-destructive measuring system that is very sensitive and offers a small measuring spot.
Accuracy of elemental analysis is often considered to be critical. For other applications speed is even more important. In addition, all users choose analyzers that can be effortlessly operated, with helpful software and effortless transfer of results into a lab network. In a number of applications, users also prize nondestructive sampling.
For years, SPECTRO MIDEX has offered top-rated XRF performance. SPECTRO MIDEX combines the most recent developments in ED-XRF detector technology, along with a greatly enhanced count rate. These smart new innovations enable it to become one of the most advanced midrange laboratory XRF benchtop analyzers available for rapid mapping of large surfaces and small spot analyses.