LSM 800 Confocal Microscope for Research and Failure Analysis

The ZEISS LSM 800, the confocal laser scanning microscope (CLSM), is ideal for materials analysis. Topography of 3D surfaces can be characterized in the lab or multi-user facility. LSM 800 allows precise, 3D imaging and analysis of semiconductors, polymers, metals, and nanomaterials.

The upright light microscope, ZEISS Axio Imager.Z2m, can be extended with a confocal scanning module. All essential light microscopy contrasting techniques for materials with high precision topography can be combined. The user will be able to save time on set-up as there is no need to change microscopes. Imaging is made easy with the help of guided workflows. The open software architecture allows users to analyze specimens with their own macro solutions.


Combine Light Microscopical and Confocal Imaging

The high-end confocal platform, LSM 800, is made for demanding materials applications both in 3D and 2D. There is a range of contrasting techniques available in the upright microscope.

  • Identify regions of interest with Circular Differential Interference Contrast (C-DIC) and execute additional investigations of topography in confocal mode
  • Image anisotropic material with polarization contrast
  • Characterize 3D structures with fluorescence in confocal mode and optical contrast

Imaging Made Easy With Guided Workflows

It is possible to reduce set-up times and speed up time-to-result by carrying out analysis and imaging without having to change microscopes.

  • A simplified user interface provides support via guided workflows
  • Users have the advantage of complete flexibility in size and orientation of the ROI
  • Define the 2D scanning area on the sample, then image and acquire only the region of interest (ROI)

Expand Your Imaging Range

A confocal unit extends widefield investigations capacity.

  • The Axio Imager.Z2m is upgradable with LSM 800 and users can take advantage of its versatility in hardware, e.g. stages, objectives and illumination
  • Users can expand their confocal microscope with Shuttle & Find for correlative microscopy. It provides a workflow from a light to an electron microscope - and vice versa. Imaging and analytical methods can be combined in an efficient manner. Access information in material analysis applications. Absolutely reproducible
  • Open Application Development (OAD) helps users define their own application world. Data can be exchanged with external programs such as MATLAB

The Confocal Principle

Image Your Entire Sample in 3D

LSM 800 is a confocal laser scanning microscope that uses laser light in a confocal beam path in order to capture defined optical sections of a sample and combine them in a three-dimensional image stack. Its aperture, usually called a pinhole, is arranged in a manner that out-of-focus information will be blocked and only in-focus information can be detected.

  • An image is generated by scanning in x,y-direction. Out-of-focus information appears dark, and in-focus information is bright
  • The sample is optically sectioned and an image stack is generated by changing the distance between sample and objective lens
  • By analyzing the intensity distribution of a single pixel through the image stack, users can calculate the corresponding height. It is then possible to combine the height information over the whole field of view to develop a height map

Rely on C Epiplan-APOCHROMAT Objectives

The apochromatically- and flat-field-corrected C Epiplan-APOCHROMAT objective series can be used for reflected light applications.

  • Benefit from imaging with enhanced contrast and high transmission in the visible spectral range
  • Obtain optimum results in standard widefield microscopy, fluorescence and differential interference contrast (DIC)
  • C Epiplan-APOCHROMAT objectives are custom designed for confocal microscopy, obtaining minimum aberrations at 405 nm over the entire field of view. This results in producing accurate topography data with less distraction noise and artifacts, revealing additional details of the surface

OAD: Your Interface to ZEN Imaging Software

ZEISS LSM 800 is available with the latest version of ZEN imaging software, which includes an open application development (OAD) interface for data exchange.

  • Users can customize and automate their workflows. When functionality beyond the basic ZEN software is needed, users can exchange data with established third-party analysis and research software, like MATLAB
  • Users can develop their own macro solution, and enjoy the benefits of an easy access to a vital set of ZEN functions and the ability to include libraries such as the.Net Framework

Inspect Surfaces in 3D with ConfoMap

ConfoMap is the ideal option to both visualize and inspect surface topography in 3D.

  • Analyze the functional performance and quality of surfaces in accordance with the recent metrology standards, e.g. ISO 25178
  • Include comprehensive functional, geometric and roughness studies to develop in depth surface analysis reports
  • Add extra modules for improved surface texture analysis, 3D Fourier analysis, grains and particle analysis, contour analysis, analysis of surface evolution, and statistics

LSM 800 Confocal Microscope for Research and Failure Analysis

Wear measure- ment on a display
3D surface topography
Porosity Sandstone
Surface texture of a geometric standard
Two-layers of a compound polymer
Combine Light Microscopical and Confocal Imaging
Imaging Made Easy With Guided Workflows
Expand Your Imaging Range
Image Your Entire Sample in 3D
Rely on C Epiplan-APOCHROMAT Objectives
OAD - Your Interface to ZEN Imaging Software
Inspect Surfaces in 3D with ConfoMap

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