Using a 4-circle X-Ray diffractometer, users can carry out advanced XRD analysis and joint studies in real time. The Thermo Scientific™ ARL™ EQUINOX 6000 X-ray Diffractometer is designed for materials science applications including residual stress analysis, reflectometry, micro-diffraction, texture measurements and thin layer analysis.
Data is measured in real time, providing a significant advantage in combined analysis and kinetics experiments. Measurements are very fast with the ARL EQUINOX 6000 system compared to other diffractometers, as the EQUINOX curved detector can simultaneously measure all diffraction peaks.
- The ARL EQUINOX 6000 X-ray diffractometer utilizes a unique tall vertical goniometer in θ/θ or θ/2θ mode along with an attached high precision Eulerian cradle
- Software applications include qualitative analysis, texture, stress, phase identification and quantification, thin film, crystal structure analysis, degree of crystallinity determination, phase transition and Rietveld analysis
- Application areas include polymers, biomaterials, metallurgy, electronics, mining, geology, photovoltaic and research