Analyzing the Reflectance Properties of Solids with the Mid-IR External Integrating Sphere

An integrating sphere is frequently an accessory of choice when examining reflectance properties of solids, studying light scattering of highly absorbing samples and collecting spectra hard to obtain with standard sampling methods. The External Integrating Sphere Accessory from Pike Technologies utilizes the external beam of the spectrometer, and is suitable for large samples because of the extra sampling space realized by placing sample underneath the sphere for precise reflectivity measurements.


  • Four inch sphere – gold-coated, Lambertian scatterer for high performance measurements
  • Accommodates large-sized sample
  • Eight degree hemispherical diffuse reflectance measurement with specular exclusion port
  • Utilizes external spectrometer beam to allow analysis of oversized samples placed under the sphere

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