Dual Beam Microscope – FEI Altura 830

The FEI Altura 830 from TSS Microscopy consists of Prelens Column, Bridge tool for wafers to small parts, SFEG UHR SEM, five-axis stage, turbo vacuum, 205 x 205 mm XY, and two GIS included along with two GIS options. Installation and custom configuration is available with 90 day warranty included.

Standard Services

Standard Services

Optional Upgrades and Services

Optional Upgrades and Services

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